Nanotechnologists gain powerful new materials probe
Researchers at the National Institute of Standards and Technology (NIST) and The Johns Hopkins University have constructed a unique tool for exploring the properties of promising new materials with unprecedented sensitivity and speed — potentially allowing them to identify quickly those most useful for nanotechnology and industrial applications.
This novel instrument, called the Multi-Axis Crystal Spectrometer (MACS), is a variation on several other spectrometers at the NIST Center for Neutron Research (NCNR), where MACS is located. Like them, MACS bombards a sample of material with low-energy neutrons, which then bounce off the sample’s constituent atoms in specific directions and with specific velocities that reflect the arrangement of atoms within the material. Analyzing how neutrons scatter from a sample can tell scientists a great deal about the material’s physical properties, but older spectrometers are limited to relatively large samples and offer less range in the conditions under which they can be tested.
“These limitations are problematic in nanotechnology,” says Professor Collin Broholm of the Johns Hopkins University, “because oftentimes you grow a new material as a tiny crystal weighing only four or five milligrams, and then you want to see how it behaves under, say, an intense magnetic field.”
Not only can MACS overcome these limitations, but its unique construction allow has additional advantages. Many spectrometers provide just a single “channel” for detection, whereas MACS offers 20, forming a semicircle behind the sample — an arrangement that leads Broholm to compare MACS to a wide-angle, high-resolution lens. These improvements mean that MACS could become a favorite tool for scientists who must choose — and choose quickly — what material to grow next.
“With previous instruments for inelastic scattering from magnetic materials, 80 milligrams is about the smallest sample you can work with,” Broholm says. “But with MACS, we might be able to get detailed information about magnetic interactions even from a nano-structured thin film sample. These are the sort of interactions that nanotechnologists are trying to take advantage of when they design and shape things at the nanoscale.”
Other news from the department research and development
These products might interest you
NEX CG II by Applied Rigaku Technologies
Elemental analysis at ppb level for exact results
ZEEnit by Analytik Jena
Zeeman Technology for Maximum Sensitivity – Matching any Analytical Problem
Transverse-heated graphite furnace for optimum atomization conditions and high sample throughput
Microspectrometer by Hamamatsu Photonics
Ultra-compact microspectrometer for versatile applications
Precise Raman, UV/VIS and NIR measurements in portable devices
NANOPHOX CS by Sympatec
Particle size analysis in the nano range: Analyzing high concentrations with ease
Reliable results without time-consuming sample preparation
Agera by HunterLab Europe
Measure color and gloss level simultaneously - in seconds
Easy-to-use colorimeter: standard-compliant, robust and precise
PlasmaQuant 9100 by Analytik Jena
PlasmaQuant 9100 Series of ICP-OES Instruments
Reveal the Details That Matter
contrAA 800 by Analytik Jena
contrAA 800 Series – Atomic Absorption. Redefined
The best of classical atomic absorption and ICP-OES spectrometry are combined in the contrAA 800
ALPHA II by Bruker
Chemical analysis made easy: compact FT-IR system
Increase the efficiency of your routine analyses with user-friendly technology
INVENIO by Bruker
FT-IR spectrometer of the future: INVENIO
Freely upgradeable and configurable FT-IR spectrometer
ERASPEC by eralytics
Spectral Fuel Analysis in Seconds with ERASPEC
Fast delivery of over 40 fuel parameters at the push of a button
SPECORD PLUS by Analytik Jena
SPECORD PLUS Series - Maximum precision in UV/Vis
The modern classic guarantees the highest quality
Micro-Z ULS by Rigaku
Accurately measure sulphur content in fuels: WDXRF analyser
Reliable routine analyses with 0.3 ppm detection limit and compact design
2060 Raman Analyzer by Metrohm
Self-calibrating inline Raman spectrometer
Analyze solids, liquids and gases - for reproducible, accurate results in the process
S4 T-STAR by Bruker
TXRF spectrometer: Sub-ppb detection limits & 24/7 analytics
Minimal operating costs because no gases, media or lab equipment are required
ZSX Primus IVi by Rigaku
High-precision WDXRF analysis for industrial applications
Maximum sensitivity and throughput for light elements and complex samples
S2 PICOFOX by Bruker
Fast and precise trace element analysis on the move
TXRF technology for minimal samples and maximum efficiency
PlasmaQuant MS Elite by Analytik Jena
LC-ICP-MS Is the Key to the World of Elemental Species
Highest Sensitivity and Lowest Detection Limits with PlasmaQuant MS Series and PQ LC
novAA® 800 by Analytik Jena
The Analyzer 4 You - novAA 800-Series
The reliable all-rounder, making routine analysis efficient and cost-effective
Quantaurus-QY by Hamamatsu Photonics
High-speed UV/NIR photoluminescence spectrometer
Precise quantum yield measurements in milliseconds without reference standards
SPECTRO ARCOS by SPECTRO Analytical Instruments
The inductively coupled plasma optical emission spectrometer (ICP-OES) for highest demands
The top-of-line SPECTRO ARCOS ICP-OES analyzer evolves elemental analysis to the next level
