Bruker AXS Wins Prestigious R&D 100 Award For Novel XFlash QUAD Detector for X-ray Microanalysis on Electron Microscopes
The XFlash QUAD detector is a key component of Bruker AXS' recently announced QUANTAX(TM) QUAD ultra-fast and sensitive Energy-Dispersive Spectroscopy (EDS) system for X-ray microanalysis on electron microscopes. The XFlash QUAD detector is the first four channel 40 mm(2) Silicon Drift Detector (SDD) for EDS. Powered by ESPRIT(TM) software, the QUANTAX QUAD delivers significantly faster EDS results across a broad range of applications. It is especially suitable for field emission scanning electron microscopes, environmental and low vacuum scanning electron microscopes.
Roger Durst, Ph.D., Executive Vice President and Chief Technology Officer at Bruker AXS, commented: "Bruker AXS has pioneered the development of Silicon Drift Detectors technology. With their unique combination of high counting rate capability and superb energy resolution, these detectors are now widely acknowledged as the new gold standard for EDS."
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Investigation with spectroscopy gives us unique insights into the composition and structure of materials. From UV-Vis spectroscopy to infrared and Raman spectroscopy to fluorescence and atomic absorption spectroscopy, spectroscopy offers us a wide range of analytical techniques to precisely characterize substances. Immerse yourself in the fascinating world of spectroscopy!
Topic World Spectroscopy
Investigation with spectroscopy gives us unique insights into the composition and structure of materials. From UV-Vis spectroscopy to infrared and Raman spectroscopy to fluorescence and atomic absorption spectroscopy, spectroscopy offers us a wide range of analytical techniques to precisely characterize substances. Immerse yourself in the fascinating world of spectroscopy!