NIST research highlights promise of AFM-IR for quantitative nanoscale chemical analysis.
"We are excited by this through work by Dr. Centrone and his colleagues," said Craig Prater, Chief Technology Officer of Anasys Instruments. "We applaud NIST's research and involvement in advancing nanoscale characterization of materials using AFM-based spectroscopy."
Original publication
"Chemical imaging beyond the diffraction limit: experimental validation of the PTIR technique."; Small 2012.
Original publication
"Chemical imaging beyond the diffraction limit: experimental validation of the PTIR technique."; Small 2012.
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