The XRF Principle

The Fundamentals of Energy Dispersive X-ray Fluorescence Technology

This white paper presents an easy-to-understand introduction into the physics and the technology of an XRF analyzer

Comparing ICP-OES Analyzers' Plasma Views: Axial, Radial, Dual, MultiView, and Dual Side-On

A Comparison of the Basic Functioning of the Technologies

This paper reviews the concepts surrounding the optical interfaces that are available for ICP-OES spectrometers and discusses the relative strengths

Effluent Phosphate Recovery & Recycling

The Latest Analytical Solutions

This report will outline the contours of the phosphorus problem, and some possible solutions.

Why Flame AAS Users Are Moving Up to ICP-OES

This paper provides an in-depth comparison of these two long-established technologies used in a wide variety of elemental analysis applications

Analysis of Fine Chemicals

ICP-OES as a Flexible Analytical Solution

In fine chemical processing, producers require a flexible analytical solution with a broad array of capabilities to meet widely varying requirements.

Which ICP-OES Optical Technology Offers Superior Performance: Echelle or ORCA?

This paper explains the fundamental differences between the two leading optical designs and discusses how each technology deals with technical challenges

Ten Reasons You Need a Next-Generation ICP-OES for Routine Analyses

Modern ICP-OES Offer Superior Performance in a Wide Range of Applications

This paper outlines ten benefits this kind of improved ICP-OES technology can deliver. Its advantages include smaller footprint; troublefree cooling;

New performance and scope for elemental analysis in academia

A new class of spectrometers offers unique new performance and flexibility

Instead of the compromised, overspecialized ICP-OES and ED-XRF instruments that many university labs have applied in the past, a new class of instrumen

Surprising New Capabilities of ED-XRF Technology

ED-XRF vs. WD-XRF

This paper charts the evolution of advanced ED-XRF against the relative stagnation of once-dominant WD-XRF spectrometer technology.

Metals and Trace Elements in Aqueous Solutions

Advanced ICP-OES Analysis with Dual Side-On Interface (DSOI) Technology

This report describes the analysis of aqueous solutions by ICP-OES with Dual Side-On Inter-face plasma observation.