Characterize beam-sensitive separator samples without damage

As one of the major components in a Li-ion battery, the battery separator plays a key role in preventing physical contact between electrodes as well as facilitating the ion transport within the cell. Because the battery separator structure is closely correlated with its performance, an in-depth understanding of its structure is essential [2]. 2D and 3D imaging are effective approaches to characterize the separator structure; however, due to the intrinsic beam sensitivity of the separator, appropriate imaging techniques are needed to accurately characterize its structure. In this application note, strategies for using scanning electron microscopy (SEM) and DualBeam technology, also known as focused ion beam-scanning electron microscopy (FIB-SEM), to image the battery separator structure are presented.