Buy Total Reflection X-Ray Fluorescence Spectrometers For Trace Element Analysis
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Buy Total Reflection X-Ray Fluorescence Spectrometers For Trace Element Analysis
S4 T-STAR by Bruker
TXRF spectrometer: Sub-ppb detection limits & 24/7 analytics
Minimal operating costs because no gases, media or lab equipment are required
The TXRF spectrometer S4 T-STAR offers lowest detection limits in the sub-ppb range ✓ TXRF offers lowest operation costs and does not require gases, media or lab infrastructure ✓ The system is optimized for 24/7 operation in industrial routine analysis ✓
S2 PICOFOX by Bruker
Fast and precise trace element analysis on the move
TXRF technology for minimal samples and maximum efficiency
Simultaneous multi-element trace analysis, including halogenides ✓ Analysis of smallest sample amounts in the nanogram or microgram range ✓ Simple quantification using an internal standard without daily calibration ✓
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