Buy Products For Semiconductor Manufacturing
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Buy Products For Semiconductor Manufacturing
DM8000 M & DM12000 M by Leica
See More, Detect Faster
High-throughput Inspection Systems
Design prevents dust accumulation, currents, ensuring clean analysis and inspection chambers ✓ Maximum lateral resolution with 150X UV lens ✓ The 0.7X USP objective allows you to see a larger field, reducing analysis time ✓
DVM6 by Leica
DON'T SEARCH. FIND!
Fast, reliable, and easy to use
Explore in a flexible way ✓ Investigate your samples with ease ✓ Rely on your results ✓
ICP Accessories by AHF analysentechnik
ICP Analysis: Optimal accessories for your ICP device
Increase your analysis efficiency with perfectly fitting accessories
Optimize your ICP analyses with sample introduction components perfectly matched to your application. Discover our wide range of accessories!
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