Buy Microscopes For Failure Analysis
Purchase microscopes the easy way: Discover all products and suppliers for failure analysis. Find out product prices easily by requesting a quote. Tip: Select a quick entry below to view selected microscopes by product category or supplier.
Buy Microscopes For Failure Analysis
DM6 M by Leica
Upright Material Microscope
All Set and remembered
Motorized high precision 2-gear focus drive ✓ Motorized 6-fold or 7-fold objective nosepiece ✓ Leica DM6 M + software = ideal inspection system for accuracy and repeatability ✓
DM8000 M & DM12000 M by Leica
See More, Detect Faster
High-throughput Inspection Systems
Design prevents dust accumulation, currents, ensuring clean analysis and inspection chambers ✓ Maximum lateral resolution with 150X UV lens ✓ The 0.7X USP objective allows you to see a larger field, reducing analysis time ✓
Emspira 3 by Leica
Inspiring simple inspection
Inspect with a single system
Save time with quick sample identification ✓ Measure and annotate directly during visual inspection without a PC ✓ Get crisp images with less manual effort ✓
DVM6 by Leica
DON'T SEARCH. FIND!
Fast, reliable, and easy to use
Explore in a flexible way ✓ Investigate your samples with ease ✓ Rely on your results ✓
DMi8 A by Leica
Inverted Microscope for Industrial Applications Leica DMi8
See more of your sample
Switch from macro (35 mm) to nano (1 nm) with one click ✓ See more details with unique UC-3D illumination ✓ Intuitive handling for faster work ✓
Apreo 2 Scanning Electron Microscope by Thermo Fisher Scientific
Apreo 2 SEM: Scanning Electron Microscope with Impressive Resolution Specifications
Unmatched versatility powered by ChemiSEM Technology
High-performance SEM for nanometer or sub-nanometer resolution performance on materials ✓ Extreme flexibility for a wide range of sample types, including insulators, sensitive materials etc ✓ Less time spent on maintenance with an optics system that aligns itself (SmartAlign Technology) ✓
JEOL SEM Series by JEOL
Scanning electron microscopy: Flexible systems for research and industry
From benchtop devices to FEG-SEM: customised solutions for precise analyses
SEMs ranging from ultrahigh-resolution, high-end field-emission device to easy-entry desk-top unit ✓ Flexible long-life instruments with easy handling, compact dimensions and excellent data acqisition ✓ Efficient and reliable service solutions and customizable accessories (EDS, WDS, EBSD, GatherX, etc) ✓
LUMOS II by Bruker
FT-IR microscopy in the fast lane - the LUMOS II
One infrared microscope for all
Our focus: highest data quality and measurement speed ✓ Simple operating concept: users are trained in minutes ✓ Smart sustainability: does not require any costly consumables ✓
HYPERION II by Bruker
FT-IR and IR laser imaging (QCL) microscope for research and development
Analyze macroscopic samples with microscopic resolution (5 µm) in seconds
Diffraction limited high sensitivity (FT-)IR microscopy and imaging at maximum speed ✓ Infrared laser imaging in all measurement modes (ATR, Transmission, Reflectance) ✓ Coherence reduction for artifact free Laser Imaging measurements without sensitivity or speed loss ✓
Choose microscopes by product category
LUMOS II by Bruker
FT-IR microscopy in the fast lane - the LUMOS II
One infrared microscope for all
HYPERION II by Bruker
FT-IR and IR laser imaging (QCL) microscope for research and development
Analyze macroscopic samples with microscopic resolution (5 µm) in seconds
Buy microscopes for Failure analysis from these suppliers
Buy microscopes for the lab or the production process
DM8000 M & DM12000 M by Leica
See More, Detect Faster
High-throughput Inspection Systems
Apreo 2 Scanning Electron Microscope by Thermo Fisher Scientific
Apreo 2 SEM: Scanning Electron Microscope with Impressive Resolution Specifications
Unmatched versatility powered by ChemiSEM Technology
DMi8 A by Leica
Inverted Microscope for Industrial Applications Leica DMi8
See more of your sample
JEOL SEM Series by JEOL
Scanning electron microscopy: Flexible systems for research and industry
From benchtop devices to FEG-SEM: customised solutions for precise analyses
LUMOS II by Bruker
FT-IR microscopy in the fast lane - the LUMOS II
One infrared microscope for all
HYPERION II by Bruker
FT-IR and IR laser imaging (QCL) microscope for research and development
Analyze macroscopic samples with microscopic resolution (5 µm) in seconds
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