ZSX Primus IV

The ZSX Primus IV XRF spectrometer is a high power (4kW) sequential WDXRF instrument that combines high-throughput with industry-leading light element sensitivity and resolution.

Rigaku’s unique tube-above optical configuration virtually eliminates the possibility of debris being deposited on the X-ray source or detector. This ensures accuracy of measurements as well as avoiding unwanted maintenance, making it the ideal choice for pressed powders and liquids.

The ZSX Primus IV is ideal for the most demanding industrial and academic chemical analysis applications e.g. mining and minerals, cement, alloys, liquids, plated metals etc.

Key Features

• High throughput with dual loading position – ideal for industrial applications
• High power 4kW X-ray source with excellent long-term stability
• Tube above optics minimizes contamination issues
• Compact size and lightweight floor standing WDXRF
• Superior light element sensitivity
• Point/mapping analysis
• Automatic compensation for uneven sample surfaces
• Uses the most innovative curved analyzing crystal technologies for highest intensities
• Intuitive ZSX Guidance software
•  Availability of He as well as N₂ purge for analyzing liquids and loose powders

High-Throughput Analysis and Automated Sample Handling

The system has been optimised for high-speed, automated analysis, making it ideal for industrial applications requiring rapid turnaround times. Improved mechanical and electronic designs have resulted in reduced dead time and higher sample throughput. Increased throughput speeds are also aided by a Digital Multi-Channel Analyzer (D-MCA) system that provides high-speed processing for high count rates culminating in improved analytical precision.

Light Element Performance
The Rigaku ZSX Primus IV also offers exceptional light element detection limits thanks to a 30 µm Be window on the X-ray tube, the thinnest commercially available as well as especially developed analyzer crystals, with dedicated 2d values, to capture light element wavelengths

For ultra-light elements (Be – O) and light elements with low energy X-ray emissions (F – Al), the degree of vacuum greatly impacts the X-ray intensity. The APC (Automatic Pressure Control) enables steady state vacuum conditions to be maintained and facilitates reproducible X-ray intensities for these elements.

More Consistent Analyses

It also features Rigaku’s optical system that suppresses signal variations that are produced because of changes in the distance between sample and detector due to uneven surfaces etc.

Point Mapping

The ZSX Primus IV also allows you to perform point mapping. Using a high-resolution camera, you can easily zoom in on a specific feature of interest and carry out chemical analysis which is ideal for inhomogeneous samples such as minerals or alloy inclusions.

Improved SQX Software

Through continuous refinements, Rigaku’s SQX analysis gets easier to use. It is a highly accurate method for determination of the elemental composition of your sample based on standardless FP analysis.

ZSX Guidance Software

ZSX Guidance supports you in all aspects of XRF measurement and data analysis. Common to all Rigaku WDXRF spectrometers, ZSX guidance puts even the most complex measurements and analyses in the hands of any user while facilitating all your routine and scheduled measurements.