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Cleanliness Expert
Target contamination fast
Fast-forward to your results
Work flexibly today and in the future
Get more insights on particles
The right cleanliness analysis solution for your needs
Technical cleanliness plays a central role in quality control. It determines performance, lifetime, and overall product quality for various industries. Examples include automotive parts and electronic components, lubricants, hydraulic fluids, oils, and pharmaceutical products. Reliable and efficient cleanliness analysis is necessary to ensure quality. Efficient and reliable cleanliness analysis solutions from Leica Microsystems enable suppliers and manufacturers to ensure better product performance and lifetime through the analysis of particle quantity, size, and composition.
Perform more efficient and reliable particle counting and classification according to international and regional standards with a selection of dedicated configurations tailored to meet your specific requirements.
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Mikroskopiesysteme: Cleanliness Expert
Target contamination fast
Product classification Cleanliness Expert
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alphaCART by WITec
Mobile Raman microspectroscopy: laboratory analysis directly on the object
Non-destructive analysis of large, immobile samples that do not fit under a microscope
DM8000 M & DM12000 M by Leica
See More, Detect Faster
High-throughput Inspection Systems
Apreo 2 Scanning Electron Microscope by Thermo Fisher Scientific
Apreo 2 SEM: Scanning Electron Microscope with Impressive Resolution Specifications
Unmatched versatility powered by ChemiSEM Technology
ParticleScout by WITec
Find particles automatically, classify them precisely and identify them easily with Raman microscopy
Accelerated and extremely precise analysis of microplastics, pharmaceutics and foods or beverages
JEOL SEM Series by JEOL
Scanning electron microscopy: Flexible systems for research and industry
From benchtop devices to FEG-SEM: customised solutions for precise analyses
LUMOS II by Bruker
FT-IR microscopy in the fast lane - the LUMOS II
One infrared microscope for all
Ivesta 3 by Leica
New stereomicroscope unites high resolution with great depth of field
You get reliable results faster, thanks to clearer images
DMi8 A by Leica
Inverted Microscope for Industrial Applications Leica DMi8
See more of your sample
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Topic World Particle Analysis
Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!
Topic World Particle Analysis
Particle analysis methods allow us to study tiny particles in various materials and reveal their properties. Whether in environmental monitoring, nanotechnology or the pharmaceutical industry, particle analysis gives us a glimpse into a hidden world where we can decipher the composition, size and shape of particles. Experience the fascinating world of particle analysis!
