Energy dispersive X-ray fluorescence spectrometers:
NEX DE VS
High-performance X-ray fluorescence spectrometer for precise and fast elemental analyses
Applied Rigaku Technologies, Inc.
The Rigaku NEX DE VS is a high-performance, direct excitation energy dispersive X-ray fluorescence (EDXRF) spectrometer that provides rapid, non-destructive qualitative and quantitative elemental analysis of sodium (Na) to uranium (U) with small spot analysis capabilities. NEX DE VS serves a broad range of applications and industries and is an ideal tool for measuring low ppm levels up to high weight percent concentrations. It is well-suited for exploration, research, bulk RoHS inspection, education, forensics, and industrial and production monitoring applications.
NEX DE VS delivers high-performance results when analysis time or sample throughput is critical. It has a 60 kV, 12 W X-ray tube, single and multilayer tube filters, and a high-performance silicon drift detector (SDD) that supports count rates over 500K cps. The high-count rates provide low limits of detection and excellent spectral resolution, and high-throughput measurements are obtained with various interchangeable automatic sample changers. These features enable the NEX DE VS to deliver the highest precision analytical results in the shortest possible measurement times. Additionally, NEX DE VS features QuantEZ® software designed to maximize time for its users. The intuitive instrument control, simple menu navigation, and EZ Analysis interface simplify routine operations and allow operators to create new applications using a simple flow bar wizard.
For small spot analysis needs, NEX DE VS features a high-resolution camera and automated collimators to allow for precise positioning of samples to analyze 1 mm, 3 mm, and 10 mm spot sizes. The instrument’s large sample chamber accommodates samples up to 30 cm in diameter and 10 cm tall, and the Point Analysis interface and integrated backlit camera allow easy sample positioning for small spot measurements. NEX DE VS is an excellent system for measuring coatings on smaller parts, screening small samples for electronic waste initiatives, or investigating the identification of foreign matter of unknown composition.
Whether on the plant floor or in a QC lab, NEX DE VS provides unparalleled performance for bulk and small-spot analysis. The superior analytical power, flexibility, and ease of use add to its broad appeal for an ever-expanding range of applications, including basic quality control (QC) or its more sophisticated variants, such as analytical quality control (AQC), quality assurance (QA), or statistical process control like Six Sigma.
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Energy dispersive X-ray fluorescence spectrometers: NEX DE VS
High-performance X-ray fluorescence spectrometer for precise and fast elemental analyses