SPECTRO ARCOS
The inductively coupled plasma optical emission spectrometer (ICP-OES) for highest demands
The SPECTRO ARCOS inductively coupled plasma optical emission spectrometer (ICP-OES) excels in industrial and academic applications for the most advanced elemental analysis of metals, chemicals, petrochemicals, and other materials.
The periscope-free MultiView mechanism lets an operator literally "turn" a radial-view instrument into an axial-view device, or vice-versa, in 90 seconds or less. MultiView now includes dual side-on plasma observation. The two optical interfaces add sensitivity and eliminate contamination/matrix compatibility issues.
Line-array detectors, based on complementary metal-oxide-semiconductor (CMOS) technology, eliminates blooming, reads trace elements’ low signals even in the vicinity of intense matrix lines, offers a high dynamic range, and eliminates on-chip cooling.
The design of the SPECTRO ARCOS ensures exceptionally low operating costs over a long, reliable service life.
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ICP-OES spectrometer: SPECTRO ARCOS
The inductively coupled plasma optical emission spectrometer (ICP-OES) for highest demands