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Total reflection x-ray fluorescence spectrometers:

S4 T-STAR

High Performance TXRF Spectrometer for Ultra-Trace Element Analysis

Bruker Nano GmbH

The TXRF spectrometer S4 T-STAR offers lowest detection limits in the sub-ppb range

TXRF offers lowest operation costs and does not require gases, media or lab infrastructure

The system is optimized for 24/7 operation in industrial routine analysis

The benchtop TXRF spectrometer S4 T-STAR for ultra-trace ...
The workflow processes of the S4 T-STAR TXRF spectromete ...
The S4 T-STAR offers a high capacity of up to 90 sample ...
The benchtop TXRF spectrometer S4 T-STAR for ultra-trace ...
The workflow processes of the S4 T-STAR TXRF spectromete ...
The S4 T-STAR offers a high capacity of up to 90 sample ...

Rapid and Cost-efficient TXRF - an Alternative to ICP

The S4 T-STAR is a versatile tool for the analysis of a broad range of sample types including suspensions, powders, nanoparticles or films. This puts it ahead of ICP, which requires fully dissolved liquid samples.

The TXRF spectrometer provides a powerful solution for water, effluent, air and soil analysis for the recovery of a healthy environment; for example, environmental monitoring by direct measurement of contaminants in wastewater, slurries and effluents in the low ppb range. It accelerates biomedical research for tomorrow’s healthy society. The S4 T-STAR measures catalyzer elements in pharmaceutical research according to the values given by US and EU Pharmacopeia guidelines; for example, detection of sub-ppm catalyzer elements in active pharmaceutical ingredients (API) and additives.

TXRF is a powerful technology for food fraud prevention in globalized supply chains; for example, food safety according to FAO/WHO standards.

Specifications

Type: elemental analyzers
Elements: N/A
Sample type: N/A
Gas supply: N/A
Analysis time (sec): N/A
Oven temperature (°C): N/A
Detection: Totalreflexions-Röntgenfluoreszenz-Spektrometrie
Application field: Chemistry, Pharma
The benchtop TXRF spectrometer S4 T-STAR for ultra-trace ...

1

The benchtop TXRF spectrometer S4 T-STAR for ultra-trace element analysis provides 24/7 routine operation and guaranteed data quality.

The workflow processes of the S4 T-STAR TXRF spectromete ...

2

The workflow processes of the S4 T-STAR TXRF spectrometer are fast and convenient and minimize errors and contamination risks.

The S4 T-STAR offers a high capacity of up to 90 sample ...

3

The S4 T-STAR offers a high capacity of up to 90 sample discs. It supports automated batch processing.

Request information about S4 T-STAR now

The benchtop TXRF spectrometer S4 T-STAR for ultra-trace element analysis provides 24/7 routine operation and guaranteed data quality.

Total reflection x-ray fluorescence spectrometers: S4 T-STAR

High Performance TXRF Spectrometer for Ultra-Trace Element Analysis

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Find S4 T-STAR and related products in the theme worlds

Topic world Elemental analysis

Elemental analysis is a fundamental pillar of chemical research and enables the quantitative determination of the basic elements contained in a compound. It gives insight into the atomic composition and provides essential information about the structure and properties of molecules.

30+ products
25+ whitepaper
30+ brochures
View topic world
Topic world Elemental analysis

Topic world Elemental analysis

Elemental analysis is a fundamental pillar of chemical research and enables the quantitative determination of the basic elements contained in a compound. It gives insight into the atomic composition and provides essential information about the structure and properties of molecules.

30+ products
25+ whitepaper
30+ brochures