Quality control - 1 News by Rigaku from Germany

Quality control - 1 News by Rigaku from Germany

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Unique X-ray Topography Based Defect Characterization for SiC Wafers Honored with Georg Waeber Innovation Award 2023

02-Nov-2023 - A cross-organizational team from Rigaku SE and Fraunhofer IISB has established a new semiconductor material characterization method in their jointly operated Center of Expertise for X-ray Topography in Erlangen, Germany. They succeeded not only in developing an industry-ready X-ray topography ...

quality control semiconductor analysis semiconductors

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