The dark side of transmission X-ray microscopy

Researchers develop a novel method to make scattered light usable for X-ray imaging in the nanometer range

20-Jun-2024 - X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult to detect small cracks or tiny inclusions in the images. By developing a new method, researchers at the ...