New general manager at Oxford Instruments WITec in Ulm

18-Dec-2024 - The next era has begun at Oxford Instruments WITec, where Dr. Benjamin Tordoff is leading the Raman imaging microscopy pioneers after taking over from the company's founders. Dr. Benjamin Tordoff joined Oxford Instruments WITec this summer, though the company and its exceptional technology that ...

Unique X-ray microscope paves the way to more powerful batteries

New insights into the morphological and chemical changes in battery materials

21-Nov-2024 - New cathode materials are being developed to further increase the capacity of lithium batteries. Multilayer lithium-rich transition metal oxides (LRTMOs) offer particularly high energy density. However, their capacity decreases with each charging cycle due to structural and chemical changes. ...

New procedure for better thermoplastics

New insights thanks to nano imaging and spectroscopy at the IRIS beamline of BESSY II

06-Nov-2024 - Bio-based thermoplastics are produced from renewable organic materials and can be recycled after use. Their resilience can be improved by blending bio-based thermoplastics with other thermoplastics. However, the interface between the materials in these blends sometimes requires enhancement to ...

New method for measuring luminescence lifetime offers breakthrough in scientific imaging

Ac­cel­er­at­ing the pace of dis­cov­ery in sci­ence and in­dustry

22-Oct-2024 - Re­search­ers at the Max Planck In­sti­tute for Mar­ine Mi­cro­bi­o­logy, Leib­niz-In­sti­tute for Baltic Sea Re­search and Uni­versity of Copen­ha­gen in­tro­duce an in­nov­at­ive ap­proach to im­age lu­min­es­cence life­times. This simple ap­proach uses read­ily-avail­able cost-ef­fect­ive ...

The dark side of transmission X-ray microscopy

Researchers develop a novel method to make scattered light usable for X-ray imaging in the nanometer range

20-Jun-2024 - X-ray microscopes are essential for examining components and materials because they can be used to detect changes and details in the material. Until now, however, it has been difficult to detect small cracks or tiny inclusions in the images. By developing a new method, researchers at the ...

Advanced imaging techniques on a semiconductor material reveal ‘surprising’ hidden activity

"This surprising and previously overlooked observation completely changes how we need to view this technology"

10-Apr-2024 - For the first time, a team of researchers has observed a semiconductor material actively flipping behavior from that of an insulator to that of a metal and back in a real device geometry using advanced imaging techniques. This unique imaging of a live fully-functioning electronic device using ...

Checking items of clothing using a smartphone, AI and infrared spectroscopy

Also suitable for food and skin testing

06-Oct-2023 - Researchers at Fraunhofer have developed an ultra-compact near-infrared spectrometer suitable for recognizing and analyzing textiles. Mixed fabrics can also be reliably identified through the combination of imaging, special AI (artificial intelligence) algorithms and spectroscopy. The technology ...

New technique paves way for imaging individual molecules

Pioneering experiment exploits quantum properties of X-ray light

04-May-2023 - An international research team has succeeded for the first time in using X-rays for an imaging technique that exploits a particular quantum property of light. As the researchers describe in their work just published in the journal Physical Review Letters, this technique could enable imaging of ...

New monochromator optics for tender X-rays

Highly precise spectromicroscopic measurements of nanostructured systems

06-Dec-2022 - Until now, it has been extremely tedious to perform measurements with high sensitivity and high spatial resolution using X-ray light in the tender energy range of 1.5 - 5.0 keV. Yet this X-ray light is ideal for investigating energy materials such as batteries or catalysts, but also biological ...

High-speed imaging of microchips

Novel method enables fast X-ray scans of large objects with nanometre resolution

20-Jun-2022 - A new method speeds up X-ray imaging of extended samples like microchips. The innovative technique makes it possible to study relatively large objects to nanometre fine details in a reasonable amount of time. That is not only interesting to science but also to industry, as the developer team led ...