Argonne scientists pinpoint mechanism to increase magnetic response of ferromagnetic semiconductor
EuO may help usher in next generation of microelectronics
Now scientists at the U.S. Department of Energy's Argonne National Laboratory have manipulated electron mobility and pinpointed the mechanism controlling the strength of magnetic interactions- and hence the material's magnetic ordering temperature.
"EuO is a ferromagnetic semiconductor and is a material that can carry spin polarized currents, which is an integral element of future devices aimed at manipulating both the spin and the charge of electrons in new generation microelectronics," Argonne's Postdoctoral researcher Narcizo Souza-Neto said.
Using powerful X-rays from the Advanced Photon Source to probe the material's electronic structure under pressure, Souza-Neto and Argonne Physicist Daniel Haskel report in Physical Review Letters that localized, 100 percent polarized Eu 4f electrons become mobile under pressure by hybridizing with neighboring, extended electronic states. The increased mobility enhances the indirect magnetic coupling between Eu spins resulting in a three-fold increase in the ordering temperature.
While the need for large applied pressures may seem a burden for applications, large compressive strains can be generated at interfacial regions in EuO films by varying the mismatch in lattice parameter with selected substrates. By pinpointing the mechanism the research provides a road map for manipulating the ordering temperatures in this and related materials, e.g., through strain or chemical substitutions with the ultimate goal of reaching 300 Kelvin (room temperature).
"Manipulation of strain adds a new dimension to the design of novel devices based on injection, transport, and detection of high spin-polarized currents in magnetic/semiconductor hybrid structures", Haskel said.
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