SPECTRO announces the release of the SPECTRO XEPOS Low Sulfur XRF Analyzer
The new SPECTRO XEPOS Low sulfur Analyzer provides a detection limit of less than 1 ppm (µg/g) for Sulfur in fuels. Employing SPECTRO's proprietary polarized excitation geometry, a factor 10 improvement in sensitivity is realized compared to conventional EDXRF. Better signal to background ratios and, most importantly, shorter measurement times are achieved.
The benchtop SPECTRO XEPOS Low Sulfur Analyzer comes equipped with specially designed sample cups that eliminate the possibility of contamination or leakage. A unique sampling system allows safe sample input without having to shut down the x-ray source - saving time and ensuring long term precision of results.
Unlike WDXRF and UV technology, the SPECTRO XEPOS Low Sulfur Analyzer:
* Is simple and easy to operate and does not require specially trained operators.
* Calibrations exhibit excellent long term stability
* Requires virtually no maintenance
* Is not influenced by differences in sample density and viscosity
* Does not require special air conditioning
Other news from the department research and development
Get the chemical industry in your inbox
From now on, don't miss a thing: Our newsletter for the chemical industry, analytics, lab technology and process engineering brings you up to date every Tuesday and Thursday. The latest industry news, product highlights and innovations - compact and easy to understand in your inbox. Researched by us so you don't have to.
