FEI Introduces Tecnai(TM) G2 -- The Next Generation of Industry-Leading TEMs

10-Aug-2001

FEI Company today introduced the next generation of its award winning Tecnai TEMs. Carrying the name Tecnai G2, the new series features the second generation models of the renowned Tecnai series that was introduced in 1998. Tecnai's All in One concept has made it possible for both experts and non-experts to utilize the most advanced TEM, STEM and nano-analysis techniques for semiconductor, data storage, materials research, and structural biology applications.

The ultra-high resolution, ease of operation, and faster time to data delivered by the Tecnai G2 allow customers to make technology shifts more easily, push research boundaries, and bring new, advanced products and therapeutics to market in less time.

According to Ben Bormans, FEI's business line manager for TEM and sample management solutions, "The Tecnai G2 Series allows faster time to data for TEM analysis in semiconductor and data storage applications, structural biology and research. Increasingly, time to data is critically important for customers in these markets as they drive their research and product development and seek to gain better efficiency."

The advanced Tecnai G2 Series features the Windows(R) 2000 operating system, automatic aperture control, complete remote control capabilities, and automatic set-up of optimized parameters for all operating modes. The Tecnai Imaging and Analysis software allows automated data-acquisition using advanced spectrum imaging and tomography techniques.

The new Tecnai G2 series also includes the highly advanced F20 U-Twin STEM. This tool combines the ultimate resolution in TEM with the ultimate resolution in STEM to make it possible for conducting sub-nanometer chemical profiling using advanced Energy Dispersive X-ray Spectroscopy (EDS) and Electron Energy Loss Spectroscopy (EELS). The F20 U-Twin STEM features an improved ultra-high resolution objective lens, a new, very high-stability scanning system, and high-sensitivity electron detection system.

"Atomic Resolution STEM delivers valuable information that's complementary to TEM," explained Timon Fliervoet, FEI's product manager for materials research. "STEM gives high-contrast images down to the one Angstrom level and provides an excellent reference image for chemical analysis. Researchers and process development engineers need this tool to better characterize the morphology and chemistry of gate oxides, catalyst particles, and grain boundaries in ceramics. Understanding the characteristics and properties of advanced, man-made devices and structures requires understanding where specific types of atoms are located."

Systems in the Tecnai G2 series can be configured for analytical, liquid helium, tomography, general life science, semiconductor, and life science applications, among others.

FEI's Tecnai TEMs have received numerous awards worldwide, including the Good Design Award (G-Mark) from the Japanese Industrial Design Promotion Organization (JIDPO), and the Product of the Year Award from the Oregon Tech Awards 2000. Both TEM users and critics have acclaimed the Tecnai as the roadmap for all future TEMs. More than 250 of the first generation Tecnai's have been sold since their introduction.

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