WITec exhibits on Laser 2003 in Munich
On the Laser 2003 in Munich, the world leading trade fair for optical technologies, WITec GmbH, Germany will exhibit its newest developments in the field of scanning probe microscopes. From 23. -26. June, WITec will showcase on booth C1.161 modular, high resolution microscopy systems for materials science, fundamental research, life science and nanotechnology. The new mercury 100 AFM with the integrated Digital Pulsed Force Mode will be presented as well as the confocal Raman Microscope CRM200 and the AlphaSNOM with its unique cantilever technology. Visitors will have the opportunity to have a closer look at the instruments and discuss their applications with the WITec-specialists.
The Mercury 100 AFM, a new Atomic Force Microscopy (AFM) system, is designed specifically for materials research and nanotechnology. The integrated scientific-grade research microscope and the Digital Pulsed Force Mode, a new measurement mode for AFM, allows nondestructive imaging of various material properties along with the topography.Highly precise components for scanning, beam deflection or vibration isolation are used to ensure ease of operation and optimized sample investigation. A modular design for the first time guarantees upgrade possibilities from AFM to Confocal / Raman microscopy as well as Scanning Near-field Optical Microscopy (SNOM). Please contact us at:
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