WITec exhibits on Laser 2003 in Munich
The Mercury 100 AFM, a new Atomic Force Microscopy (AFM) system, is designed specifically for materials research and nanotechnology. The integrated scientific-grade research microscope and the Digital Pulsed Force Mode, a new measurement mode for AFM, allows nondestructive imaging of various material properties along with the topography.Highly precise components for scanning, beam deflection or vibration isolation are used to ensure ease of operation and optimized sample investigation. A modular design for the first time guarantees upgrade possibilities from AFM to Confocal / Raman microscopy as well as Scanning Near-field Optical Microscopy (SNOM). Please contact us at:
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