Microscopy Today Innovation Award for ZEISS microscope

07-Aug-2015 - Germany

ZEISS MultiSEM 505 has been selected by a team of judges from Microscopy Today magazine as a recipient of the 2015 Microscopy Today Innovation Award.

As the first multiple-beam scanning electron microscope (SEM) in the world, the system uses 61 beams simultaneously, and offers a capture speed of up to 1220 megapixels per second with an image resolution of four nanometer.

Other news from the department research and development

These products might interest you

Apreo 2 Scanning Electron Microscope

Apreo 2 Scanning Electron Microscope by Thermo Fisher Scientific

Apreo 2 SEM: Scanning Electron Microscope with Impressive Resolution Specifications

Unmatched versatility powered by ChemiSEM Technology

scanning electron microscopes
JEOL SEM Series

JEOL SEM Series by JEOL

Scanning electron microscopy: Flexible systems for research and industry

From benchtop devices to FEG-SEM: customised solutions for precise analyses

Loading...

Most read news

More news from our other portals

All FT-IR spectrometer manufacturers at a glance