Carl Zeiss wins G.I.T. InnovationsAward 2012 for AURIGA Laser
Carl Zeiss Microscopy launched the FIB SEM in March this year. The system combines the advantages of the CrossBeam workstation with the capabilities of a pulsed micro-focus laser for fast ablation of material. The system is suited for the microscopic examination of samples where the target structure is buried under material layers. The special laser removes the material without destroying the sample. It enables ablation rates comparable to mechanical removal. Applications include semiconductor manufacturing, photovoltaics, polymer electronics, oil and gas prospection, geomechanical consulting, pharmaceuticals, life sciences and materials research in general.
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