PANalytical’s Empyrean wins 2011 R&D 100 Award
Awarded under the, ‘winning technology’ category, Empyrean has the unique ability to measure all sample types – from powders to thin films, from nanomaterials to solid objects – on a single instrument. Truly unique to Empyrean is the system’s ability to see inside solid objects without having to cut them up. Using computed tomography (CT) analysis, it becomes possible to determine the area of interest for subsequent X-ray diffraction analysis, or check the presence of pores or inclusions inside the object.
“We are truly honored to receive this prestigious award,” said Jan van Rijn, General Manager X-Ray Systems at PANalytical. “It is gratifying to be recognized for our commitment to developing new generation platforms, products and solutions that enable innovation within multiple industries, helping them to survive and thrive amidst today’s challenges.”
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