WITec: True Surface Microscopy wins prestigious 2011 R&D100 Award
WITec’s True Surface Microscopy has been selected as a winner of the prestigious 2011 R&D 100 Award. It honors the WITec innovation as one of the 100 most technologically significant developments of the year. True Surface Microscopy allows confocal Raman imaging guided by surface topography. The topographic coordinates measured from an integrated profilometer are used to perfectly follow the sample surface in confocal Raman imaging mode. The result is an image revealing optical or chemical properties at the surface of the sample, even if this surface is very rough or heavily inclined. Previously in March 2011, True Surface Microscopy received the PITTCON 2011 Editors Gold Award.
“With True Surface Microscopy we have made another technological leap which will enable our customers to explore new avenues in their scientific field” says Dr. Olaf Hollricher, Managing Director Research & Development. “This second award further validates our claim of always providing cutting-edge innovations and is a great recognition of the success of our product strategy”
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