Visualization of the origin of magnetic forces by atomic resolution electron microscopy
Accelerating research and development on state-of-the-art materials such as magnets, semiconductors and quantum technology
Naoya Shibata
Electron microscopes have the highest spatial resolution among all currently used microscopes. However, in order to achieve ultra-high resolution so that atoms can be observed directly, we have to observe the sample by placing it in an extremely strong lens magnetic field. Therefore, atomic observation of magnetic materials that are strongly affected by the lens magnetic field such as magnets and steels had been impossible for many years. For this difficult problem, the team succeeded in developing a lens that has a completely new structure in 2019. Using this new lens, the team realized atomic observation of magnetic materials, which is not affected by the lens magnetic field. The team’s next goal was to observe the magnetic fields of atoms, which are the origin of magnets (magnetic force), and they continued technological development to achieve the goal.
This time, the joint development team took on the challenge of observing the magnetic fields of iron (Fe) atoms in a hematite crystal (α-Fe2O3) by loading MARS with a newly developed high-sensitivity high-speed detector, and further using computer image processing technology. To observe the magnetic fields, they used the Differential Phase Contrast (DPC) method at atomic resolution, which is an ultrahigh-resolution local electromagnetic field measurement method using a scanning transmission electron microscope (STEM), developed by Professor Shibata et al. The results directly demonstrated that iron atoms themselves are small magnets (atomic magnet). The results also clarified the origin of magnetism (antiferromagnetism) exhibited by hematite at the atomic level.
From the present research results, the observation on atomic magnetic field was demonstrated, and a method for observation of atomic magnetic fields was established. This method is expected to become a new measuring method in the future that will lead the research and development of various magnetic materials and devices such as magnets, steels, magnetic devices, magnetic memory, magnetic semiconductors, spintronics and topological materials.
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