List of materials analysis methods

List of materials analysis methods:

AED: Auger electron diffraction
AES: Auger electron spectroscopy
AFM: Atomic force microscope
APS: Appearance potential spectroscopy
CAICISS: Coaxial impact collision ion scattering spectroscopy
CL: Cathodoluminescence
CDI: Coherent Diffraction Imaging
DMA: Dynamic mechanical analysis
DVS: Dynamic vapour sorption
EBIC: Electron beam induced current
EBSD: Electron backscatter diffraction
EDX: Energy dispersive X-ray spectroscopy
EID: Electron induced desorption
EPMA: Electron Probe Microanalysis
ESCA: Electron spectroscopy for chemical analysis; see XPS
EPR: Electron paramagnetic resonance spectroscopy
ESD: Electron stimulated desorption
ESR: Electron spin resonance spectroscopy (same as EPR)
EXAFS: Extended x-ray absorption fine structure
FEM: Field emission microscopy
FIB: Focused ion beam microscopy
FIM-AP: field ion microscopy-Atom probe
FTIR: Fourier transform infrared absorption spectroscopy; e.g., ATR (Attenuated Total Reflection), GI (Grazing Incidence), DRIFTS (Diffuse Reflectance)
GDMS: Glow discharge mass spectrometry
GDOS: Glow discharge optical spectroscopy
GISAXS: Grazing Incidence Small Angle X-ray Scattering
GIXD: Grazing Incidence X-ray Diffraction
GIXR: Grazing Incidence X-ray Reflectivity
HAS: Helium atom scattering
HREELS: High resolution electron energy loss spectroscopy
HRTEM: High-resolution transmission electron microscopy

IAES: Ion induced Auger electron spectroscopy
ICP-MS: Inductively coupled plasma mass spectrometry
IGA: Intelligent gravimetric analysis
IIX: Ion induced X-ray analysis
INS: Ion neutralization spectroscopy
IRS: Infra Red spectroscopy
ISS: Ion scattering spectroscopy
LEED: Low-energy electron diffraction
LEEM: Low-energy electron microscopy
LEIS: Low-energy ion scattering
LIBS: Laser induced breakdown spectroscopy:also: LIPS:Laser induced plasma spectroscopy
LOES: Laser optical emission spectroscopy
LS: Light (Raman) scattering
MS: Mass spectrometry
MEIS: Medium energy ion scattering
MTA: Microthermal analysis
NDP: Neutron depth profiling
NEXAFS: Near edge X-ray absorption fine structure
NMR: Nuclear magnetic resonance spectroscopy
NSOM: Near-field optical microscope
OES: Optical Emission Spectroscopy
PAX: Photo emission of Adsorbed Xenon
PD: Photodesorption
PDEIS: Potentiodynamic electrochemical impedance spectroscopy
PED: Photoelectron diffraction (also called XPD, PhD, ARPEFS)
PIXE: Particle (or proton) induced X-ray spectroscopy
PTMS: Photothermal microspectroscopy
RBS: Rutherford backscattering spectroscopy
REM: Reflection electron microscopy
RHEED: Reflection high energy electron diffraction
SAXS: Small Angle X-ray Scattering
SCANIIR: Surface composition by analysis of neutral species and ion-impact radiation

This article is licensed under the GNU Free Documentation License. It uses material from the Wikipedia article "List_of_materials_analysis_methods". A list of authors is available in Wikipedia.

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